EXPERIMENTAL-DETERMINATION OF THE X6 SHEAR TETRAGONAL DEFORMATION POTENTIAL OF ALAS

被引:14
作者
CHARBONNEAU, S
YOUNG, JF
COLERIDGE, PT
KETTLES, B
机构
[1] Institute for Microstructural Sciences, National Research Council of Canada, Ottawa
来源
PHYSICAL REVIEW B | 1991年 / 44卷 / 15期
关键词
D O I
10.1103/PhysRevB.44.8312
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The X6 shear tetragonal deformation potential of AlAs, E2, is estimated by studying the effect of uniaxial stress on the time-resolved photoluminescence spectra from two type-II AlAs/Al0.15Ga0.85As superlattices at 5 K. The time-resolved technique provides a direct measure of the energy separation of excitons associated with the in-plane and out-of-plane X valleys in the AlAs, thus removing complications due to the stress dependence of the valence-band energy. The value of E2 obtained from two samples with different layer thicknesses is 5.8 +/- 0.1 eV.
引用
收藏
页码:8312 / 8314
页数:3
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