PERFORMANCE OF A FIELD-EMISSION GUN SCANNING ELECTRON-MICROSCOPE COLUMN

[1] EXPERIMENTELLE BESTIMMUNG DER ENERGIEVERTEILUNG IN THERMISCH AUSGELOSTEN ELEKTRONENSTRAHLEN [J]. ZEITSCHRIFT FUR PHYSIK, 1954, 139 (02): : 115 - 146

[2] FIELD-EMISSION GUNS FOR ELECTRON-PROBE INSTRUMENTS [J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 1975, 38 (04) : 513 - 529

[3] CLEAVER JRA, 1973, SEM IITRI, P50

[4] CREWE AV, 1973, PROGR OPTICS, V11, P225

[5] DITCHFIELD RW, 1977, OPTIK, V48, P163

[6] THE FIELD EMITTER - FABRICATION, ELECTRON MICROSCOPY, AND ELECTRIC FIELD CALCULATIONS [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) : 570 - 576

[7] FERT C, 1967, FOCUSING CHARGED PAR, V1, P339

[8] FRANK L, 1974, OPTIK, V41, P245

[9] GAUKLER KH, 1975, OPTIK, V42, P391

[10] HAINFELD JF, 1977, SEM IITRI, P591

[1] EXPERIMENTELLE BESTIMMUNG DER ENERGIEVERTEILUNG IN THERMISCH AUSGELOSTEN ELEKTRONENSTRAHLEN [J]. ZEITSCHRIFT FUR PHYSIK, 1954, 139 (02): : 115 - 146

[2] FIELD-EMISSION GUNS FOR ELECTRON-PROBE INSTRUMENTS [J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 1975, 38 (04) : 513 - 529

[3] CLEAVER JRA, 1973, SEM IITRI, P50

[4] CREWE AV, 1973, PROGR OPTICS, V11, P225

[5] DITCHFIELD RW, 1977, OPTIK, V48, P163

[6] THE FIELD EMITTER - FABRICATION, ELECTRON MICROSCOPY, AND ELECTRIC FIELD CALCULATIONS [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) : 570 - 576

[7] FERT C, 1967, FOCUSING CHARGED PAR, V1, P339

[8] FRANK L, 1974, OPTIK, V41, P245

[9] GAUKLER KH, 1975, OPTIK, V42, P391

[10] HAINFELD JF, 1977, SEM IITRI, P591