K X-RAY YIELDS FROM ELEMENTS OF LOW ATOMIC NUMBER

被引:22
作者
CAMPBELL, AJ
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D O I
10.1098/rspa.1963.0135
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
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页码:319 / +
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共 46 条
[1]  
ALLEN S, CITED INDIRECTLY
[2]  
ALLEN SJM, 1962, HANDBOOK CHEMISTRY P, P2766
[3]   BACK SCATTERING OF ELECTRONS [J].
ARCHARD, GD .
JOURNAL OF APPLIED PHYSICS, 1961, 32 (08) :1505-&
[4]  
ARCHARD GD, 1960, 2ND P S XRAY MICR MI, P331
[5]  
ARCHARD GD, PRIVATE COMMUNICATIO
[6]  
Bethe H, 1930, ANN PHYS-BERLIN, V5, P325
[7]  
Bethe H. A., 1938, P AM PHILOS SOC, V78, P573
[8]   THE ELECTRON PROBE - AN ADDED DIMENSION IN CHEMICAL ANALYSIS [J].
BIRKS, LS .
ANALYTICAL CHEMISTRY, 1960, 32 (09) :A19-&
[9]   THE MEASUREMENT AND INTERPRETATION OF THE K-AUGER INTENSITIES OF SN-113, CS-137, AND AU-198 [J].
BROYLES, CD ;
THOMAS, DA ;
HAYNES, SK .
PHYSICAL REVIEW, 1953, 89 (04) :715-724
[10]   The Auger effect [J].
Burhop, EHS .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1935, 148 (A864) :0272-0284