OBSERVATION OF DIFFERENCES BETWEEN LOW-ENERGY ELECTRON-DIFFRACTION AND POSITRON-DIFFRACTION STRUCTURAL DETERMINATIONS OF THE CLEAVAGE FACES OF CDSE

被引：31

作者：

HORSKY, TN

BRANDES, GR

CANTER, KF

DUKE, CB

HORNG, SF

KAHN, A

LESSOR, DL

MILLS, AP

PATON, A

STEVENS, K

STILES, K

机构：

[1] PACIFIC NW LAB, RICHLAND, WA 99352 USA

[2] PRINCETON UNIV, DEPT ELECT ENGN, PRINCETON, NJ 08544 USA

[3] AT&T BELL LABS, MURRAY HILL, NJ 07974 USA

[4] XEROX CORP, WEBSTER RES CTR, WEBSTER, NY 14580 USA

来源：

PHYSICAL REVIEW LETTERS | 1989年 / 62卷 / 16期

关键词：

D O I：

10.1103/PhysRevLett.62.1876

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1876 / 1879

页数：4

共 19 条

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[8] THE INFLUENCE OF ELECTRON EXCHANGE AND RELATIVISTIC CORRECTIONS ON ELASTIC LOW-ENERGY ELECTRON-DIFFRACTION FROM COMPOUND SEMICONDUCTORS [J].

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[10] THEORY VERSUS EXPERIMENT IN LOW-ENERGY POSITRON DIFFRACTION BY CU(111) [J].

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