FIELD-ION ATOM PROBE ANALYSIS

被引：25

作者：

TURNER, PJ ^{[1
]}

REGAN, BJ ^{[1
]}

SOUTHON, MJ ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,DEPT MET & MAT SCI,CAMBRIDGE,ENGLAND

来源：

SURFACE SCIENCE | 1973年 / 35卷 / 01期

关键词：

D O I：

10.1016/0039-6028(73)90223-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：336 / 344

页数：9

共 8 条

[1] CONSTRUCTION AND PERFORMANCE OF AN FIM-ATOM PROBE [J].

BRENNER, SS ;

MCKINNEY, JT .

SURFACE SCIENCE, 1970, 23 (01) :88-&

[2] TIMER AND EVENT ACCUMULATOR FOR FIM ATOM PROBE [J].

JOHNSON, CA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (12) :1812-&

[3] PLASMON EFFECTS IN FIELD ION EMISSION [J].

LUCAS, AA .

PHYSICAL REVIEW LETTERS, 1971, 26 (14) :813-&

[4] TIME DEPENDENCE OF FIELD IONIZATION FOLLOWING EVAPORATION PULSE IN ATOM-PROBE FIM [J].

MCLANE, SB ;

MULLER, EW ;

KRISHNASWAMY, SV .

SURFACE SCIENCE, 1971, 27 (02) :367-+

[5] ATOM-PROBE FIM ANALYSIS OF INTERACTION OF IMAGING GAS WITH SURFACE [J].

MULLER, EW ;

KRISHNASWAMY, SV ;

MCLANE, SB .

SURFACE SCIENCE, 1970, 23 (01) :112-+

[6] FIELD ADSORPTION AND DESORPTION OF HELIUM AND NEON [J].

MULLER, EW ;

MCLANE, SB ;

PANITZ, JA .

SURFACE SCIENCE, 1969, 17 (02) :430-&

[7] ATOM-PROBE FIELD ION MICROSCOPE [J].

MULLER, EW ;

PANITZ, JA ;

MCLANE, SB .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (01) :83-&

[8] USE OF A CHANNELLED IMAGE INTENSIFIER IN FIELD-ION MICROSCOPE [J].

TURNER, PJ ;

CARTWRIGHT, P ;

SOUTHON, MJ ;

VANOOSTR.A ;

MANLEY, BW .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08) :731-+

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