EVALUATION OF MODEL FOR THERMALLY STIMULATED LUMINESCENCE AND CONDUCTIVITY - RELIABILITY OF TRAP DEPTH DETERMINATIONS

被引：141

作者：

KIVITS, P ^{[1
]}

HAGEBEUK, HJL ^{[1
]}

机构：

[1] EINDHOVEN UNIV TECHNOL,DEPT PHYS,EINDHOVEN,NETHERLANDS

来源：

关键词：

D O I：

10.1016/0022-2313(77)90002-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1 / 27

页数：27

共 47 条

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