PRACTICAL APPLICATION OF HGI2 DETECTORS TO A SPACE-FLIGHT SCANNING ELECTRON-MICROSCOPE

被引:3
作者
BRADLEY, JG
CONLEY, JM
ALBEE, AL
IWANCZYK, JS
DABROWSKI, AJ
WARBURTON, WK
机构
[1] CALTECH,PASADENA,CA 91125
[2] UNIV SO CALIF,INST PHYS,MARINA DEL REY,CA 90292
关键词
D O I
10.1016/0168-9002(89)91383-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:348 / 351
页数:4
相关论文
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