DESIGN CONSIDERATIONS FOR A BEAM SCANNER AT THE UNIVERSITY-OF-MANITOBA CYCLOTRON FACILITY

被引：3

作者：

HADDOCK, C

KONOPASEK, F

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1980年 / 172卷 / 03期

关键词：

D O I：

10.1016/0029-554X(80)90326-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：407 / 411

页数：5

共 11 条

[1] WIDE APERTURE HIGH GAIN BEAM PROFILE SCANNER [J].

BOND, CD ;

GORDON, SE .

NUCLEAR INSTRUMENTS & METHODS, 1972, 98 (03) :513-&

[2] A SIMPLE ION BEAM SCANNER [J].

JAGGER, JW ;

PAGE, JG ;

RILEY, PJ .

NUCLEAR INSTRUMENTS & METHODS, 1967, 49 (01) :121-&

[3]

JOHNSON K, 1963, APR INT C SECT FOC C, P311

[4] DUAL WIRE BEAM-SCANNER [J].

MCILWAIN, A .

NUCLEAR INSTRUMENTS & METHODS, 1976, 136 (03) :511-512

[5] A 10-CHANNEL SECUNDARY EMISSION MONITOR FOR ELECTRON BEAM ANALYZING PURPOSES [J].

PICENI, HAL ;

DEVRIES, C .

NUCLEAR INSTRUMENTS & METHODS, 1967, 51 (01) :87-&

[6] SCANNING ELECTRON BEAM PROFILE MONITOR [J].

REAGAN, D .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (09) :1190-&

[7] DESCRIPTION OF DEVICE USED TO MEASURE ION BEAM EMITTANCE [J].

ROSE, PH ;

BROOKS, NB ;

WITTKOWER, AB ;

AIREY, J ;

BASTIDE, RP .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1964, 35 (10) :1283-&

[8]

SHIGERU O, 1970, REV SCI INSTR, V41, P1537

[9]

TAKACS J, 1965, IEEE T NUCL SCI JUN, P980

[10]

TOROPOV AS, 1974, NUCL INSTR METH, V114, P101

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