ANODIC OXIDE-FILMS ON HG1-XCDXTE

The formation of native oxides on Hg1-xCdxTe (x = 0.205) by anodic oxidation in 0.1M KOH in methanol and in solutions of 90% ethylene glycol-10% buffered aqueous solutions with pH varying from 6 to 10 is described. The anodic oxide films are characterized by optical properties such as refractive index and bandgap; electrical properties such as dielectric constant at room temperature and at 77°K and specific resistivity; and chemical properties such as their reactivity in various solvents. It is shown that the predominant constituent of the native oxide is TeO2. © 1979, The Electrochemical Society, Inc. All rights reserved.