Visualization of tight-binding calculations - The electronic structure and electron localization of the Si(100) surface

被引:16
作者
Fassler, TF
Haussermann, U
Nesper, R
机构
[1] Laboratorium für Anorganische Chemie, Eidgenössischen Technischen Hochschule Zürich, CH-8092
关键词
chemical bonding; electron localization; scanning tunnelling microscopy; surface structures; tight-binding calculations;
D O I
10.1002/chem.19950010910
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The advantage of computer graphics in the visualization of tight-binding calculations is highlighted in a model study of the reconstruction of the Si(100) surface. Three different surface models-the unreconstructed surface Si(100)-(1 x 1), and symmetric and asymmetric pairing of surface atoms Si(100)-(2 x 1)-are investigated on the basis of density of states (DOS), local (projected) density of stales (LDOS) and crystal orbital-overlap population (COOP) analysis. For the visualization of the real-space properties of tight-binding calculations, two- and three-dimensional images of the total (TED) and partial electron densities (PED) are shown. The PED calculated near the Fermi level are compared to densities of HOMOs and LUMOs in molecular systems and used to analyse constant current mode STM images, obtained by applying bias voltages of different sign. They shaw excellent agreement with STM experiments. The electron-localization function (ELF) has been shown to describe chemical bonds in molecules and solids surprisingly well. Here, the ELF is calculated for surfaces. In order to visualize the shape of the ''dangling'' surface bonds and bonds connecting surface atoms, two- and three-dimensional representations of the ELF are discussed. Using the reconstruction of the Si(100) surface as an example, we show that combining methods for extracting information from quantum mechanical calculations, such as PED, TED and ELF, leads to a more comprehensive description of the electronic surface structure. With the help of computer graphics, chemical concepts routinely used for describing local properties of molecules can be transferred very effectively to extended systems.
引用
收藏
页码:625 / 633
页数:9
相关论文
共 121 条
[1]  
Albert M. R., 1987, SURFACE SCI GUIDE OR, DOI 10.1002/ange.19881000432
[2]   LOW-ENERGY ION-SCATTERING FROM THE SI(001) SURFACE [J].
AONO, M ;
HOU, Y ;
OSHIMA, C ;
ISHIZAWA, Y .
PHYSICAL REVIEW LETTERS, 1982, 49 (08) :567-570
[3]   SI(100) SURFACE RECONSTRUCTION - SPECTROSCOPIC SELECTION OF A STRUCTURAL MODEL [J].
APPELBAUM, JA ;
BARAFF, GA ;
HAMANN, DR .
PHYSICAL REVIEW LETTERS, 1975, 35 (11) :729-732
[4]   THEORY OF RECONSTRUCTION INDUCED SUBSURFACE STRAIN - APPLICATION TO SI(100) [J].
APPELBAUM, JA ;
HAMANN, DR .
SURFACE SCIENCE, 1978, 74 (01) :21-33
[5]  
APPELBAUM JA, 1976, SURF SCI B, V14, P729
[6]   PROPOSAL FOR SYMMETRIC DIMERS AT THE SI(100)-2X1 SURFACE [J].
ARTACHO, E ;
YNDURAIN, F .
PHYSICAL REVIEW LETTERS, 1989, 62 (21) :2491-2494
[7]  
Ashcroft N.D.M., 1976, SOLID STATE PHYS
[8]   ATOM-RESOLVED SURFACE-CHEMISTRY USING THE SCANNING TUNNELING MICROSCOPE [J].
AVOURIS, P .
JOURNAL OF PHYSICAL CHEMISTRY, 1990, 94 (06) :2246-2256
[9]   PREDICTION OF THE EFFECT OF THE SAMPLE BIASING IN SCANNING TUNNELING MICROSCOPY AND OF SURFACE-DEFECTS ON THE OBSERVED CHARACTER OF THE DIMERS IN THE SI(001)-(2X1) SURFACE [J].
BADZIAG, P ;
VERWOERD, WS ;
VANHOVE, MA .
PHYSICAL REVIEW B, 1991, 43 (03) :2058-2062
[10]   CLUSTER MODEL ELECTRONIC-STRUCTURE CALCULATIONS FOR IDEAL AND HYDROGEN CHEMISORBED SI(100) SURFACES [J].
BATRA, IP ;
CIRACI, S ;
ORTENBURGER, IB .
SOLID STATE COMMUNICATIONS, 1976, 18 (05) :563-565