CONTRAST OF ELECTRON MICROGRAPHS

被引:14
作者
HALLIDAY, JS
QUINN, TFJ
机构
来源
BRITISH JOURNAL OF APPLIED PHYSICS | 1960年 / 11卷 / 11期
关键词
D O I
10.1088/0508-3443/11/11/302
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:486 / 491
页数:6
相关论文
共 20 条
[2]   VARIATION OF CONTRAST IN ELECTRON MICROSCOPE IMAGES WITH SIZE OF OBJECTIVE APERTURE [J].
COUPLAND, JH .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1956, 69 (06) :642-646
[3]   DIFFERENTIAL SCATTERING CROSS-SECTION OF ATOMS TO MEDIUM ENERGY ELECTRONS AT SMALL ANGLES [J].
HAINE, ME ;
AGAR, AW .
BRITISH JOURNAL OF APPLIED PHYSICS, 1959, 10 (08) :341-347
[4]   CONTRAST ARISING FROM ELASTIC AND INELASTIC SCATTERING IN THE ELECTRON MICROSCOPE [J].
HAINE, ME .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1957, 34 (01) :9-15
[5]  
HAINE ME, 1956, 1ST P REG C EL MICR, P32
[6]   EXPERIMENTAL STUDY OF ELECTRON SCATTERING IN ELECTRON MICROSCOPE SPECIMENS [J].
HALL, CE ;
INOUE, T .
JOURNAL OF APPLIED PHYSICS, 1957, 28 (11) :1346-1348
[7]   SCATTERING PHENOMENA IN ELECTRON MICROSCOPE IMAGE FORMATION [J].
HALL, CE .
JOURNAL OF APPLIED PHYSICS, 1951, 22 (05) :655-662
[8]   THE CONTRAST, BREADTHS AND RELATIVE INTENSITIES OF ELECTRON DIFFRACTION RINGS [J].
HALLIDAY, JS .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1960, 254 (1276) :30-&
[9]   MEASUREMENT OF ATOMIC DIFFERENTIAL SCATTERING CROSS-SECTIONS [J].
HALLIDAY, JS .
BRITISH JOURNAL OF APPLIED PHYSICS, 1960, 11 (06) :259-263
[10]   *DER STREUQUERSCHNITT VON ATOMEN FUR UNELASTISCHE STREUUNG SCHNELLER ELEKTRONEN [J].
KOPPE, H .
ZEITSCHRIFT FUR PHYSIK, 1948, 124 (7-12) :658-664