INFLUENCE OF THE ROUGHNESS PROFILE ON THE SPECULAR REFLECTIVITY OF X-RAYS AND NEUTRONS

被引：125

作者：

DEBOER, DKG

机构：

[1] Philips Research Laboratories, 5656 AA Eindhoven

来源：

PHYSICAL REVIEW B | 1994年 / 49卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.49.5817

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

For the calculation of specular x-ray and neutron reflectivity from rough surfaces two expressions exist, which are valid under different circumstances. Another expression is derived using the second-order distorted-wave Born approximation, which smoothly connects the two existing expressions. The shape of the reflectivity curve depends not only on the average roughness, but also on the lateral correlation of the roughness profile.

引用

页码：5817 / 5820

页数：4

共 18 条

[1]

Beckmann P., 1963, SCATTERING ELECTROMA

[2] UTILIZATION OF SPECULAR X-RAY REFLECTION, DIFFUSE X-RAY REFLECTION OR PLANAR X-RAY REFLECTION TO STUDY THIN-FILMS OR SURFACES [J].