COMPUTER-SIMULATED ELECTRON MICROGRAPHS OF CRYSTAL DEFECTS

被引：13

作者：

SKALICKY, P ^{[1
]}

机构：

[1] TH VIENNA, INST ANGEWANDTE PHYSIK, VIENNA, AUSTRIA

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1973年 / 20卷 / 01期

关键词：

D O I：

10.1002/pssa.2210200102

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：11 / 52

页数：42

共 57 条

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