DETERMINATION OF OPTICAL CONSTANTS FROM REFLECTANCE OR TRANSMITTANCE MEASUREMENTS ON BULK CRYSTALS OR THIN FILMS

被引：168

作者：

VERLEUR, HW

机构：

来源：

关键词：

D O I：

10.1364/JOSA.58.001356

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1356 / &

共 16 条

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ANDERMANN, G
CARON, A
DOWS, DA
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (10P1) : 1210 - +
[2] BARKER AS, 1964, PHYS REV, V135, P1732
[3] BARKER AS, 1967, FERROELECTRICITY
[4] KRAMERS-KRONIG ANALYSIS OF REFLECTANCE MEASURED AT OBLIQUE INCIDENCE
BERREMAN, DW
[J]. APPLIED OPTICS, 1967, 6 (09): : 1519 - &
[5] EVALUATION OF 1-ANGLE REFLECTION TECHNIQUE FOR DETERMINATION OF OPTICAL CONSTANTS
BOWLDEN, HJ
WILMSHURST, JK
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1963, 53 (09) : 1073 - &
[6] OPTICAL PROPERTIES OF THIN GERMANIUM FILMS IN WAVELENGTH RANGE 2000-6000 A
GRANT, PM
PAUL, W
[J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (08) : 3110 - &
[7] HASS G, 1964, PHYSICS THIN FILM ED, V2
[8] Heavens O. S., 1955, OPTICAL PROPERTIES T
[9] HEAVENS OS, 1964, PHYSICS THIN FILMS, V2
[10] HEAVENS OS, 1965, OPTICAL PROPERTIES T, pCH4