A DIRECT METHOD OF CORRECTION OF X-RAY DIFFRACTION LINE PROFILES .2. EFFECT OF RECEPTOR SLIT ON REGISTRATION OF AN X-RAY DIFFRACTION LINE PROFILE

被引：22

作者：

LOUER, D

WEIGEL, D

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY | 1969年 / A 25卷

关键词：

D O I：

10.1107/S0567739469000556

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：338 / &

共 10 条

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[7] A NUMERICAL FOURIER-ANALYSIS METHOD FOR THE CORRECTION OF WIDTHS AND SHAPES OF LINES ON X-RAY POWDER PHOTOGRAPHS [J].

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[10] PROPAGATION OF SOME SYSTEMATIC ERRORS IN X-RAY LINE PROFILE ANALYSIS [J].

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