DIELECTRIC LOSS DETERMINATION USING PERTURBATION

被引：1

作者：

ANDRAWIS, MY

DAVIS, WA

RIAD, SM

ELSHABINIRIAD, A

机构：

[1] VIRGINIA POLYTECH INST & STATE UNIV,BRADLEY DEPT ELECT ENGN,BLACKSBURG,VA 24061

[2] VIRGINIA POLYTECH INST & STATE UNIV,TIME DOMAIN LAB,BLACKSBURG,VA 24061

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1992年 / 41卷 / 06期

关键词：

Dielectric properties of solids;

D O I：

10.1109/19.199388

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A perturbation approach is used to separate the conductor loss from the total measured loss of a dielectric material which fills a nonresonant reflection cavity. The technique is limited to cavities with good conducting walls. Accurate knowledge of the conductor conductivity determines the accuracy of the obtained results. Dielectric loss tangent is estimated over a frequency range typically from 45 MHz to 5 GHZ.

引用

页码：1032 / 1035

页数：4