CRYSTAL-GROWTH OF OXIDE THIN-FILMS USING MASS-SEPARATED LOW-ENERGY O+ ION-BEAMS

被引:2
作者
KITA, R
机构
来源
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 1994年 / 8卷 / 1-2期
关键词
D O I
10.1142/S0217979294000087
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new technique developed for growing high-quality oxide thin films by molecular beam epitaxy (MBE) is described. The technique uses low-energy and high density O+ ion beams mass-separated from an oxygen plasma, as an oxidation source. Since O+ ion beams have great oxidation ability and kinetic energy, the technique enables us to grow oxide films by MBE not only under ultrahigh vacuum comparable to the environment where semiconductors are prepared, but also at low temperatures. The application of the technique to the MBE growth of CuO, BaO, SrO and Sr-Cu-O thin films is also described.
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页码:183 / 205
页数:23
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