A HIGH TEMPERATURE X-RAY DIFFRACTOMETER FOR OPERATION UP TO 2500 DEGREES C

被引：11

作者：

BAKER, TW

BALDOCK, PJ

SPINDLER, WE

机构：

来源：

JOURNAL OF SCIENTIFIC INSTRUMENTS | 1966年 / 43卷 / 11期

关键词：

D O I：

10.1088/0950-7671/43/11/304

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：803 / &

共 14 条

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[2]

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SPINDLER, WE ;

BAKER, TW .

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[4] AN X-RAY DIFFRACTION STUDY OF VARIATION OF LATTICE PARAMETERS AND THEIR RATIO FOR BERYLLIUM OXIDE AT TEMPERATURES UP TO 2000 DEGREES C [J].

BALDOCK, PJ ;

SPINDLER, WE ;

BAKER, TW .

JOURNAL OF NUCLEAR MATERIALS, 1966, 19 (02) :169-&

[5]

CAMPBELL WJ, 1961, RI5738 US BUR MIN RE

[6] ADAPTATION OF A GEIGER-COUNTER X-RAY DIFFRACTOMETER FOR HIGH-TEMPERATURE INVESTIGATIONS [J].

CHIOTTI, P .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1954, 25 (07) :683-688

[7]

FERGUSON IF, 1963, AERER4548 UKAEA REP

[8]

GOLDSCHMIDT HJ, 1964, HIGHTEMPERATURE XRAY

[9]

KLEIN DJ, 1958, NAASR2542 AT INT REP

[10] AN EXPERIMENTAL INVESTIGATION OF EXTRAPOLATION METHODS IN THE DERIVATION OF ACCURATE UNIT-CELL DIMENSIONS OF CRYSTALS [J].

NELSON, JB ;

RILEY, DP .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1945, 57 (321) :160-177

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