INSITU SYNCHROTRON STUDIES OF THE STRUCTURAL-PROPERTIES OF Y-BA-CU-O THIN-FILMS DURING GROWTH

被引：10

作者：

ZHENG, JQ ^{[1
]}

WANG, XK ^{[1
]}

SHIH, MC ^{[1
]}

WILLIAMS, S ^{[1
]}

SO, J ^{[1
]}

LEE, SJ ^{[1
]}

DUTTA, P ^{[1
]}

CHANG, RPH ^{[1
]}

KETTERSON, JB ^{[1
]}

机构：

[1] NORTHWESTERN UNIV,MAT RES CTR,EVANSTON,IL 60208

来源：

APPLIED PHYSICS LETTERS | 1991年 / 58卷 / 20期

关键词：

D O I：

10.1063/1.104906

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report the first real time, in situ synchrotron x-ray studies of Y-Ba-Cu-O thin-film growth on (100) SrTiO3 using a miniature, faced-magnetron sputtering system. A combination of the substrate temperature and the deposition rate determines whether the film grows along the a, c, or multiple axes.

引用

收藏

页码：2303 / 2304

页数：2

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