IMAGING WITH A LOW-ENERGY-ELECTRON MICROSCOPE

被引：31

作者：

TROMP, RM

REUTER, MC

机构：

[1] T.J. Watson Research Center, IBM Research Division, Yorktown Heights, NY 10598

来源：

ULTRAMICROSCOPY | 1993年 / 50卷 / 02期

关键词：

D O I：

10.1016/0304-3991(93)90007-K

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Low-energy electron microscopy (LEEM) is a relatively new technique for real-time imaging of surfaces. Lateral resolution is in the 150 angstrom range and single-height atomic steps can be observed. In this paper we describe how to set up a low-energy electron microscope and obtain images in the different imaging modes.

引用

页码：171 / 178

页数：8

共 5 条

[1] THE RESOLUTION OF THE LOW-ENERGY ELECTRON REFLECTION MICROSCOPE [J].