PHASE-SHIFTING REAL-TIME HOLOGRAPHIC-INTERFEROMETRY THAT USES BISMUTH SILICON-OXIDE CRYSTALS

被引：38

作者：

GEORGES, MP

LEMAIRE, PC

机构：

[1] Centre Spatial de Liège, Université de Liège, Parc Scientifique du Sart Tilman, Liege, 4031, Avenue du Pré-Aily

来源：

APPLIED OPTICS | 1995年 / 34卷 / 32期

关键词：

HOLOGRAPHIC MATERIALS; HOLOGRAPHY; HOLOGRAPHY APPLICATIONS; INTERFEROMETRY; METROLOGY; NONDESTRUCTIVE TESTING; PHOTOREFRACTIVE MATERIALS;

D O I：

10.1364/AO.34.007497

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A bismuth silicon oxide crystal is used in the diffusion regime as a dynamic recording medium in a real-time holographic interferometer based on anisotropic self-diffraction, This device is connected with an interferogram-analysis method that uses the phase-shifting technique for quantitative measurement of diffusive-reflecting object deformations. In addition to the usual error sources in phase shifting, the temporal interferogram erasure is studied and is found weakly perturbative for the measured phase. It is shown that quantitative measurements are possible for low-intensity object beams (8 mu W/cm(2)) and a large observed area. A practical situation of defect monitoring in a composite structure is presented. (C) 1995 Optical Society of America

引用

页码：7497 / 7506

页数：10

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