ACTIVE FREQUENCY TECHNIQUE FOR PRECISE MEASUREMENTS ON DYNAMIC MICROWAVE CAVITY PERTURBATIONS

被引：9

作者：

AKYEL, C

BOSISIO, RG

APRIL, GE

机构：

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1978年 / 27卷 / 04期

关键词：

D O I：

10.1109/TIM.1978.4314713

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：364 / 368

页数：5

共 15 条

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[9] DYNAMIC-RESPONSE OF A RESONANT FREQUENCY TRACKING SYSTEM [J].

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[10] AUTOMATIC MONITOR FOR MICROWAVE RESONATORS [J].

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