MICROWAVE EMISSION FROM N-TYPE INSB ASSOCIATED WITH HELICAL INSTABILITY

被引：8

作者：

MUSHA, T

OHNISHI, J

HIRAKAWA, M

机构：

[1] Department of Physical Electronics, Tokyo Institute of Technology, Ookayama, Meguro-ku, Tokyo

来源：

PHYSICAL REVIEW LETTERS | 1969年 / 22卷 / 23期

关键词：

D O I：

10.1103/PhysRevLett.22.1254

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The microwave emission from n-type InSb in crossed magnetic and low electric fields at nitrogen temperature was investigated experimentally. It was found that the emission was caused by a helical instability of a high-current filament formed at an electrode contact. © 1969 The American Physical Society.

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页码：1254 / &

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