ANOMALIES IN RESISTIVITY OF THIN BI FILMS

被引：5

作者：

GARCIA, N

KAO, YH

STRONGIN, M

机构：

[1] S.U.N.Y. at Stony Brook, Stony Brook, NY

[2] Brookhaven National Laboratory, Upton, NY

[3] Brookhaven National Laboratory, Upton, NY

来源：

关键词：

D O I：

10.1016/0375-9601(69)91137-2

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：631 / &

相关论文

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