PREPARATION OF MICRON THICK SPECIMENS FOR HIGH-PRESSURE STUDY

被引：1

作者：

GUPTA, MC ^{[1
]}

RUOFF, AL ^{[1
]}

机构：

[1] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1979年 / 50卷 / 01期

关键词：

D O I：

10.1063/1.1135650

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The electrical resistance behavior of a material under very high pressure can be studied by pressing the material with a diamond indentor against a diamond flat. The high pressures generated can be calculated using Hertz's theory provided the material thickness is about a micron or less. Here we describe a method of preparing micron thick specimens of a few millimeters in size. We have prepared micron thick specimens of a few millimeters in size of Si (100), Si (111), NaCl (100). The result of high pressure study on Si (100) is also presented.

引用

页码：135 / 137

页数：3

共 9 条

[1] SURFACE FINISHING OF ALKALI-HALIDES [J].