GROWTH OF BI/SB SUPERLATTICE

被引：5

作者：

TAKAHASHI, J

MIYAGAWA, T

ARAKI, M

OBATA, T

机构：

[1] NIPPON MIN CO LTD, ANAL RES CTR, TODA, SAITAMA 335, JAPAN

[2] KAWASAKI STEEL CHEM IND CO LTD, RES INST MET SURFACE HIGH PERFORMANCE LTD, CHIBA 260, JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1992年 / 31卷 / 8A期

关键词：

BISMUTH; ANTIMONY; SUPERLATTICE; TRANSMISSION ELECTRON MICROSCOPY; SMALL-ANGLE X-RAY DIFFRACTION; THIN-FILM X-RAY DIFFRACTION;

D O I：

10.1143/JJAP.31.L1110

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The present work describes the growth at room temperature of Bi, Sb and Bi-12 at.%Sb films on glass substrates and a Bi/Sb 40-layer superlattice film on a single-crystal Si (111) substrate. Thin-film X-ray diffractometer measurements strongly show the (003) orientation of these films. Four peaks are observed in small-angle X-ray diffraction measurements of the Bi/Sb superlattice film and indicate good periodicity. Direct transmission electron microscopy (TEM) observations also clearly show the superlattice structure.

引用

页码：L1110 / L1113

页数：4

共 9 条

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