PIXE MICRO-PROBE ANALYSIS WITH THE HEIDELBERG PROTON MICRO-PROBE

被引：17

作者：

CHEN, JR ^{[1
]}

KNEIS, H ^{[1
]}

MARTIN, B ^{[1
]}

NOBILING, R ^{[1
]}

PELTE, D ^{[1
]}

POVH, B ^{[1
]}

TRAXEL, K ^{[1
]}

机构：

[1] UNIV HEIDELBERG,INST PHYS,D-6900 HEIDELBERG 1,FED REP GER

来源：

NUCLEAR INSTRUMENTS & METHODS | 1981年 / 181卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(81)90596-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：141 / 148

页数：8

共 20 条

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FERGUSON, AT
PILLING, FD
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[J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 165 (03): : 477 - 508
[5] FOLKMANN F, 1975, J PHYS E SCI INSTRUM, V8, P429, DOI 10.1088/0022-3735/8/6/001
[6] FUCHS W, 1975, J MICROSC BIOL CELL, V22, P227
[7] HIGH-SENSITIVITY LASER MICROPROBE MASS ANALYZER
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UNSOLD, E
KAUFMANN, R
NITSCHE, R
[J]. APPLIED PHYSICS, 1975, 8 (04): : 341 - 348
[8] SCANNING PROTON-INDUCED X-RAY MICROSPECTROMETRY IN AN ATMOSPHERIC ENVIRONMENT
HOROWITZ, P
GRODZINS, L
[J]. SCIENCE, 1975, 189 (4205) : 795 - 797
[9] KEIL K, 1967, FORTSCHR MINERAL, V44, P4
[10] ION PROBE MICROANALYSIS
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[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (10): : 797 - 808