ON THE INVESTIGATION OF SPECIMEN CONTAMINATION IN THE ELECTRON MICROSCOPE

被引：57

作者：

HILLIER, J

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1948年 / 19卷 / 03期

关键词：

D O I：

10.1063/1.1715049

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：226 / 230

页数：5

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共 6 条

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[3] Microanalysis by means of electrons
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[4] HILLIER J, 1945, J APPL PHYS, V16, P266
[5] ON THE IMPROVEMENT OF RESOLUTION IN ELECTRON DIFFRACTION CAMERAS
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[J]. JOURNAL OF APPLIED PHYSICS, 1946, 17 (01) : 12 - 22
[6] AN EFFECT OF ELECTRON BOMBARDMENT UPON CARBON BLACK
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[J]. JOURNAL OF APPLIED PHYSICS, 1947, 18 (02) : 153 - 161