PREPARATION AND STRUCTURAL CHARACTERIZATION OF THIN EPITAXIAL BI2SR2CACU2O8+DELTA FILMS WITH T(C) IN THE 90-K RANGE

被引:59
作者
WAGNER, P
HILLMER, F
FREY, U
ADRIAN, H
STEINBORN, T
RANNO, L
ELSCHNER, A
HEYVAERT, I
BRUYNSERAEDE, Y
机构
[1] TH DARMSTADT, INST MAT WISSENSCH, D-64289 DARMSTADT, GERMANY
[2] BAYER AG, ZENT FORSCHUNGSINST, D-47829 KREFELD, GERMANY
[3] CATHOLIC UNIV LEUVEN, VASTE STOF FYS MAGNETISME LAB, B-3030 HEVERLEE, BELGIUM
[4] UNIV PARIS 07, PHYS SOLIDES GRP, F-75251 PARIS 05, FRANCE
来源
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1993年 / 215卷 / 1-2期
关键词
D O I
10.1016/0921-4534(93)90372-W
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thin films of Bi2Sr2CaCu2O8+delta with T(c) up to 92 K were prepared by an in situ sputtering method on SrTiO3 (100) and LaAlO3 (100) substrates. A strong c-axis orientation of the film growth with low mosaic spread and full epitaxy within the ab-plane were confirmed by X-ray diffraction in Bragg-Brentano and four-circle geometry. Rutherford backscattering and channeling confirm the correct film composition and highly textured growth with a minimum yield of 23%. The surface morphology of the films was examined by STM and SEM studies, revealing a low density of precipitates and the absence of screw dislocations. The depth profile of the composition was investigated by secondary neutrals mass spectroscopy (SNMS).
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页码:123 / 131
页数:9
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