A 6-B, 4 GSA/S GAAS HBT ADC

被引:32
作者
POULTON, K
KNUDSEN, KL
CORCORAN, JJ
WANG, KC
NUBLING, RB
PIERSON, RL
CHANG, MCF
ASBECK, PM
HUANG, RT
机构
[1] ROCKWELL INT SCI CTR,THOUSAND OAKS,CA 91360
[2] ROCKWELL MICROELECTR TECHNOL CTR,NEWBURY PK,CA 91320
关键词
D O I
10.1109/4.466071
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A GaAs/AlGaAs Heterojunction Bipolar Transistor (HBT) process was developed to meet the speed, gain, and yield requirements for analog-to-digital converters (ADC's). The HBT has current gain of over 100 and f(T) and f(MAX) of over 50 GHz, A 6-b, 4 GSa/s (4 giga-samples/s) ADC was designed and fabricated in this process, The ADC uses an analog folding architecture, includes an on chip master-slave track-and-hold (T/H) circuit, and provides Gray-encoded digital outputs, The ADC achieves 5.6 effective bits at 4 GSa/s, a faster clock rate than any noninterleaved semiconductor ADC reported to date, It has a resolution bandwidth (the frequency at which effective bits has dropped by 0.5 b) of 1.8 GHz at 4 GSa/s, higher than any published ADC, The chip operates at up to 6.5 GSa/s, GaAs HBT IC's are especially prone to high operating temperatures, This led to reliability problems that were overcome by the use of a fast dc thermal simulator written for this project. A SPICE model for self-heating effects is also described.
引用
收藏
页码:1109 / 1118
页数:10
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