MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE

被引：45

作者：

CEREZO, A

GODFREY, TJ

GROVENOR, CRM

HETHERINGTON, MG

HOYLE, RM

JAKUBOVICS, JP

LIDDLE, JA

SMITH, GDW

WORRALL, GM

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1989年 / 154卷

关键词：

D O I：

10.1111/j.1365-2818.1989.tb00584.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：215 / 225

页数：11

共 25 条

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