EXAMINATION OF THIN-FILMS OF LOW-PRESSURE DIAMOND BY TRANSMISSION ELECTRON-MICROSCOPY

被引：2

作者：

CHATFIELD, C ^{[1
]}

HAUBNER, R ^{[1
]}

LUX, B ^{[1
]}

机构：

[1] TECH UNIV VIENNA,INST CHEM TECHNOL INORGAN MAT,A-1060 VIENNA,AUSTRIA

来源：

关键词：

D O I：

10.1007/BF01730066

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1188 / 1192

页数：5

相关论文

共 17 条

[1]

BADZIAN AR, 1988, MAT RES BUL

[2]

Bichler R., 1988, THESIS TU VIENNA

[3]

BICHLER R, 1987, 3RD INT C SCI HARD M

[4]

Bichler R, 1987, 6 EUR CVD C JER, P413

[5]

DERYAGIN BV, 1976, ZH EKSP TEOR FIZ+, V42, P639

[6]

Field J.E., 1979, PROPERTIES DIAMOND

[7]

FUJIMORI N, 1985, 9TH P S ISIAT 85 TOK, P237

[8]

GLASS JT, 1988, SPIE MICROOPTOELECTR, V877, P56

[9]

JOFFREAU PO, 1988, IN PRESS J REF HARD, V7

[10]

JOFFREAU PO, 1988, J REF HARD METALS, V7, P92