NEW SCANNING MICRODIFFRACTION TECHNIQUE

被引:10
作者
VANOOSTRUM, KJ [1 ]
LEENHOUTS, A [1 ]
JORE, A [1 ]
机构
[1] PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
关键词
D O I
10.1063/1.1654890
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:283 / 284
页数:2
相关论文
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[3]   SELECTED-ZONE DARK-FIELD ELECTRON-MICROSCOPY [J].
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[4]  
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