MEASURING LIFETIME OF MINORITY CARRIERS IN MIS STRUCTURES

被引：22

作者：

TOMANEK, P

机构：

来源：

SOLID-STATE ELECTRONICS | 1969年 / 12卷 / 04期

关键词：

D O I：

10.1016/0038-1101(69)90012-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

[No abstract available]

引用

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页码：301 / +

页数：1

相关论文

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