SIMULATION OF DIELECTRIC FAILURE BY MEANS OF RESISTOR-DIODE RANDOM LATTICES

被引：17

作者：

BENGUIGUI, L ^{[1
]}

机构：

[1] TECHNION ISRAEL INST TECHNOL,DEPT PHYS,IL-32000 HAIFA,ISRAEL

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.38.7211

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：7211 / 7214

页数：4

共 10 条

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