COMPARISON OF ELECTRON-DENSITIES MEASURED WITH LANGMUIR PROBES AND WITH TWO DIFFERENT MICROWAVE DEVICES

被引：8

作者：

KINDERDIJK, HM

VANECK, J

机构：

来源：

PHYSICA | 1972年 / 59卷 / 02期

关键词：

D O I：

10.1016/0031-8914(72)90083-3

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：257 / +

页数：1

共 25 条

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