共 4 条
SHORT SAMPLE TESTS OF FULL-SCALE SUPERCONDUCTING CONDUCTORS FOR LARGE HELICAL DEVICE
被引:16
作者:
MITO, T
TAKAHATA, K
YANAGI, N
YAMADA, S
NISHIMURA, A
SAKAMOTO, M
YAMAMOTO, J
机构:
[1] National Institute for Fusion Science (NIFS), Chikusa-ku, Nagoya-shi, 464–01, Furo-cho
关键词:
4;
D O I:
10.1109/20.119848
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
We have been developing superconducting conductors for the helical coils of the Large Helical Device (LHD). From the test results of scale-down R&D conductors, one conductor, KISO-4B, was selected for its simple structure and good stability. Other conductor named Design-M have been manufactured in its actual scale from the first. These two types of conductors were selected and go forward to the full-scale tests. Since both conductors have multi-layered strand cables without the transposition, it is feared that the uneven current distribution between strands may cause the degradation of the critical current. A new method of measuring the current distribution inside the conductor was introduced. A pick up coil wound on the conductor detects the magnetic flux change in the conductor longitudinal direction and becomes a sensor to measure the current distribution. Using the test facility for full-scale conductors, the Design-M conductor has been tested about the critical current and stability. From the test results of Design-M, the uneven current distribution from the outer layer strands to the inner layer strands inside the conductor was observed. However, no degradation of the critical current was measured.
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页码:214 / 217
页数:4
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