OPTICAL-CONSTANTS OF VARIOUS HEAVILY DOPED PARA-TYPE SILICON-CRYSTALS AND NORMAL-TYPE SILICON-CRYSTALS OBTAINED BY KRAMERS-KRONIG ANALYSIS

被引：28

作者：

BARTA, E ^{[1
]}

机构：

[1] HUNGARIAN ACAD SCI INST TECH PHYS,BUDAPEST,HUNGARY

来源：

INFRARED PHYSICS | 1977年 / 17卷 / 05期

关键词：

D O I：

10.1016/0020-0891(77)90034-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：319 / 329

页数：11

共 19 条

[1] INFRARED ABSORPTION IN HEAVILY DOPED N-TYPE SI
BALKANSKI, M
AZIZA, A
AMZALLAG, E
[J]. PHYSICA STATUS SOLIDI, 1969, 31 (01): : 323 - +
[2] DETERMINATION OF EFFECTIVE MASS VALUES BY A KRAMERS-KRONIG ANALYSIS FOR VARIOUSLY DOPED SILICON-CRYSTALS
BARTA, E
[J]. INFRARED PHYSICS, 1977, 17 (02): : 111 - 119
[3] FILMED SURFACES FOR REFLECTING OPTICS
HASS, G
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1955, 45 (11) : 945 - 952
[4] RESISTIVITY OF BULK SILICON AND OF DIFFUSED LAYERS IN SILICON
IRVIN, JC
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1962, 41 (02): : 387 - +
[5] JULIENNE D, 1974, CR ACAD SCI B PHYS, V278, P591
[6] Kukharskii A. A., 1970, Fizika i Tekhnika Poluprovodnikov, V4, P287
[7] LUKES F, 1960, CZECH J PHYS B, V10, P317
[8] PHILIPP HR, 1972, J APPL PHYS, V43, P2836
[9] REFRACTIVE INDEX OF SILICON
PRIMAK, W
[J]. APPLIED OPTICS, 1971, 10 (04): : 759 - &
[10] REFRACTIVE INDICES OF GERMANIUM SILICON AND FUSED QUARTZ IN FAR INFRARED
RANDALL, CM
RAWCLIFFE, RD
[J]. APPLIED OPTICS, 1967, 6 (11) : 1889 - +