VARIATION OF BRAGG-CASE DIFFRACTION CURVES OF X-RAYS FROM A THIN SILICON CRYSTAL WITH CRYSTAL THICKNESS

被引：11

作者：

HASHIZUM.H

NAKAYAMA, K

MATSUSHI.T

KOHRA, K

机构：

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1970年 / 29卷 / 03期

关键词：

D O I：

10.1143/JPSJ.29.806

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

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页码：806 / &

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