PLZT MODULATOR CHARACTERIZATION

被引：10

作者：

GOLDSTEIN, DH

机构：

[1] Air Force Wright Lab., Niceville, FL

来源：

OPTICAL ENGINEERING | 1995年 / 34卷 / 06期

关键词：

POLARIZATION ANALYSIS AND MEASUREMENT; LIGHT MODULATION; PLZT; POLARIMETRY;

D O I：

10.1117/12.202106

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A commercial PLZT modulator is characterized at wavelengths from 0.6328 mu m to the limits of its IR transmission around 9 mu m. Laser polarimetry and IR spectropolarimetry are the characterization techniques used. Polarization measurement results include diattenuation and retardation. The PLZT modulator is found to be an electrically controllable polarizer as well as an electrically controllable retarder.

引用

页码：1589 / 1592

页数：4

共 11 条

[1] FERROELECTRIC (PB,LA)(ZR,TI)O3 EPITAXIAL THIN-FILMS ON SAPPHIRE GROWN BY RF-PLANAR MAGNETRON SPUTTERING [J].