THE STRUCTURE AND THE MAGNETIC-PROPERTIES OF MN0.5(BI1-XSBX)0.5 THIN-FILMS

Mn0.5(Bi1-xSbx)0.5 films with a protective SiO layer have been prepared by vacuum evaporation onto room temperature quartz substrates. The heat treatment at various temperatures for these films were done in order to obtain the MnBiSb solid solution. When x = 0.75, a hexagonal structure with the c axis perpendicular to the basal plane has been initially found and its crystal lattice constant c is a little larger than that in MnBi and MnSb. The magnetic parameters, such as the Kerr rotation θk, the perpendicular anisotropy constant Ku, the saturation moment per Mn atom and the crystallite size in Mn0.5(Bi0.25Sb0.75)0.5 film were determined to be 2 θk = 1.0° (R = 20%), Ku = 1.2 × 106 erg/cm3, MMn = 1 μB, d = 0.1 μm respectively. This films shows good thermal stability after repeatedly annealing at 460°C for 20 h as well.