MEASUREMENT IN SUBMILLIMETER-WAVELENGTH REGION

被引：3

作者：

CHAMBERLAIN, J

机构：

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1972年 / IM21卷 / 04期

关键词：

D O I：

10.1109/TIM.1972.4314063

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：438 / +

页数：1

共 18 条

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[3]

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[6] DETERMINATION OF REFRACTIVE INDEX SPECTRA BY FOURIER SPECTROMETRY [J].

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GEBBIE, HA .

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[7] PHASE MODULATION IN FAR INFRARED (SUBMILLIMETRE-WAVE) INTERFEROMETERS .3. LASER REFRACTOMETRY [J].

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[8]

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[9]

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[10] HIGH ACCURACY SUBMILLIMETER-WAVE SOLUTION MEASUREMENTS [J].

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