DIRECT RESOLUTION AND IDENTIFICATION OF THE SUBLATTICES IN COMPOUND SEMICONDUCTORS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：23

作者：

OURMAZD, A

RENTSCHLER, JR

TAYLOR, DW

机构：

来源：

PHYSICAL REVIEW LETTERS | 1986年 / 57卷 / 24期

关键词：

D O I：

10.1103/PhysRevLett.57.3073

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：3073 / 3076

页数：4

相关论文

共 3 条

[1] LATTICE AND ATOMIC-STRUCTURE IMAGING OF SEMICONDUCTORS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
OURMAZD, A
AHLBORN, K
IBEH, K
HONDA, T
[J]. APPLIED PHYSICS LETTERS, 1985, 47 (07) : 685 - 688
[2] INTERPRETING HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROGRAPHS
SELF, PG
GLAISHER, RW
SPARGO, AEC
[J]. ULTRAMICROSCOPY, 1985, 18 (1-4) : 49 - 62
[3] Spence J.C.H., 1980, EXPT HIGH RESOLUTION