STRENGTH AND TOUGHNESS MEASUREMENT OF THIN BRITTLE COATINGS ON SUBSTRATES .1. THEORY AND MEASUREMENT

被引:26
作者
SELVERIAN, JH
ONEIL, D
机构
关键词
D O I
10.1016/0040-6090(93)90254-M
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Conventional mechanical property measurement techniques usually cannot be applied to ceramic thin films because of the small amount of material involved. A method is described to determine the ultimate tensile strength, fracture toughness, Weibull modulus, and surface energy of micron-sized ceramic films on substrates. This technique is based on measuring the radius of curvature of a coated substrate at room temperature, and equating the resulting calculated stress with a theoretical shear-lag stress distribution model using a force balance.
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页码:120 / 128
页数:9
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