DEEP ELECTRON TRAPS IN HYDROGENATED AMORPHOUS-SILICON

[1] ADLER D, 1981, AIP C P, V73, P146

[2] RECENT DEVELOPMENTS IN AMORPHOUS-SILICON SOLAR-CELLS [J]. SOLAR ENERGY MATERIALS, 1980, 3 (04): : 503 - 518

[3] COHEN D, 1980, SOL CELLS, V2, P331

[4] TRAP SPECTROSCOPY OF A-SI-H DIODES USING TRANSIENT CURRENT TECHNIQUES [J]. JOURNAL OF ELECTRONIC MATERIALS, 1980, 9 (04) : 713 - 726

[5] CRANDALL RS, RCA REV

[6] LIGHT-INDUCED DANGLING BONDS IN HYDROGENATED AMORPHOUS-SILICON [J]. APPLIED PHYSICS LETTERS, 1981, 38 (06) : 456 - 458

[7] NEGATIVE-U STATES IN GAP IN HYDROGENATED AMORPHOUS SILICON [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (13) : 889 - 891

[8] CHARACTERIZATION OF GLOW-DISCHARGE DEPOSITED A-SI-H [J]. SOLAR ENERGY MATERIALS, 1980, 3 (04): : 447 - 501

[9] NONRADIATIVE RECOMBINATION AT DEEP LEVELS IN GAAS AND GAP BY LATTICE-RELAXATION MULTIPHONON EMISSION [J]. PHYSICAL REVIEW LETTERS, 1975, 35 (22) : 1525 - 1528

[10] DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) : 3023 - 3032

[1] ADLER D, 1981, AIP C P, V73, P146

[2] RECENT DEVELOPMENTS IN AMORPHOUS-SILICON SOLAR-CELLS [J]. SOLAR ENERGY MATERIALS, 1980, 3 (04): : 503 - 518

[3] COHEN D, 1980, SOL CELLS, V2, P331

[4] TRAP SPECTROSCOPY OF A-SI-H DIODES USING TRANSIENT CURRENT TECHNIQUES [J]. JOURNAL OF ELECTRONIC MATERIALS, 1980, 9 (04) : 713 - 726

[5] CRANDALL RS, RCA REV

[6] LIGHT-INDUCED DANGLING BONDS IN HYDROGENATED AMORPHOUS-SILICON [J]. APPLIED PHYSICS LETTERS, 1981, 38 (06) : 456 - 458

[7] NEGATIVE-U STATES IN GAP IN HYDROGENATED AMORPHOUS SILICON [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (13) : 889 - 891

[8] CHARACTERIZATION OF GLOW-DISCHARGE DEPOSITED A-SI-H [J]. SOLAR ENERGY MATERIALS, 1980, 3 (04): : 447 - 501

[9] NONRADIATIVE RECOMBINATION AT DEEP LEVELS IN GAAS AND GAP BY LATTICE-RELAXATION MULTIPHONON EMISSION [J]. PHYSICAL REVIEW LETTERS, 1975, 35 (22) : 1525 - 1528

[10] DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) : 3023 - 3032