INTERFACIAL ORDER IN EPITAXIAL NISI2

[1] BENE RW, 1978, P S THIN FILM PHENOM, P21

[2] STRUCTURE MODELING OF METAL-SILICIDE LAYERS BY USING AXIAL AND PLANAR CHANNELING TECHNIQUES [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 417 - 420

[3] ISHIWARA H, UNPUBLISHED

[4] PHILLIPS JC, 1978, P S THIN FILM PHENOM, P3

[5] CALCULATION OF BACKSCATTERING-CHANNELING SURFACE PEAK [J]. SURFACE SCIENCE, 1978, 77 (03) : 513 - 522

[6] Tu K. N., 1978, Thin films. Interdiffusion and reactions, P359

[7] 1ST PHASE NUCLEATION IN SILICON-TRANSITION-METAL PLANAR INTERFACES [J]. APPLIED PHYSICS LETTERS, 1976, 28 (10) : 624 - 625

[1] BENE RW, 1978, P S THIN FILM PHENOM, P21

[2] STRUCTURE MODELING OF METAL-SILICIDE LAYERS BY USING AXIAL AND PLANAR CHANNELING TECHNIQUES [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 417 - 420

[3] ISHIWARA H, UNPUBLISHED

[4] PHILLIPS JC, 1978, P S THIN FILM PHENOM, P3

[5] CALCULATION OF BACKSCATTERING-CHANNELING SURFACE PEAK [J]. SURFACE SCIENCE, 1978, 77 (03) : 513 - 522

[6] Tu K. N., 1978, Thin films. Interdiffusion and reactions, P359

[7] 1ST PHASE NUCLEATION IN SILICON-TRANSITION-METAL PLANAR INTERFACES [J]. APPLIED PHYSICS LETTERS, 1976, 28 (10) : 624 - 625