REFRACTION EFFECT OF SCATTERED X-RAY-FLUORESCENCE AT SURFACE

被引：41

作者：

SASAKI, Y

HIROKAWA, K

机构：

[1] Institute for Materials Research, Tohoku University, Sendai, 980

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1990年 / 50卷 / 04期

关键词：

07.60.Hv; 07.85.+n; 78.70.Ck; 78.70.En;

D O I：

10.1007/BF00323597

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The angular distribution of X-ray fluorescence shows anisotropic radiation. We proved that the origin of the anisotropic radiation is X-ray refraction by using a scattered X-ray fluorescence model. Utilizing the refraction effect of X-ray fluorescence, we can obtain much information: for example, surface density, chemical condition, surface roughness, and particle diameter of element, as a new tool of studying surfaces and interfaces. We introduce a new X-ray dispersive system utilizing X-ray refraction. © 1990 Springer-Verlag.

引用

页码：397 / 404

页数：8

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