CHANNELING OF MEV PROJECTILES IN TUNGSTEN AND SILICON

Wide-angle Rutherford scattering has been used to investigate experimentally the channeling behavior of several projectiles (H1, He4, C12, O16, and Cl35) in tungsten crystals in the energy region 2 to 30 MeV; the study has also been extended to silicon crystals, using a 3.0-MeV H1 beam. The observed critical angles and minimum scattering yields are compared with theoretical predictions. In general, the agreement is excellent. In both W and Si, precise energy analysis of the scattered beam has also provided detailed information on the depth and temperature dependence of channeling; a marked difference is observed between the planar and axial channeling processes. Some preliminary measurements in Au and UO2 crystals are included. © 1968 The American Physical Society.