DETERMINATION OF THE TOTAL TEXTURE FUNCTION FROM INDIVIDUAL ORIENTATION MEASUREMENTS BY ELECTRON BACKSCATTERING PATTERN

The orientation distribution function (ODF) calculation is usually pet-formed using pole figures measured by X-ray or neutron diffraction. However. this kind of experimental technique does not allow total ODF to be determined, since the odd terms of the series expansion are not directly accessible from pole figures. The individual orientation measurement technique can be used, but it is necessary to evaluate the right orientation number necessary for a statistically reliable ODF. For samples at the surface, at the fifth of thickness from the surface and at the center of a Fe 3 pct Si sheet, this study shows that only 100 orientations are sufficient to find the principal components of the texture, but this number must be increased by a factor of 10 to evaluate with rather good accuracy the heights of the peaks. Indeed, to obtain a good correlation with an ODF calculated from pole figures measured by X-ray diffraction, the number of orientations needed is about 1000.