HIGH-RESOLUTION FRESNEL ZONE PLATES FOR SOFT X-RAYS

[1] BOGLI V, 1986, SPIE P, V733, P449

[2] CHENG PC, 1984, XRAY MICROSCOPY INST

[3] COANE PJ, 1982, 10TH P C EL ION BEAM

[4] KERN D, 1984, P SOC PHOTO-OPT INST, V447, P204, DOI 10.1117/12.939200

[5] Kirz J., 1980, SYNCHROTRON RAD RES

[6] LAMARQUE P, 1939, C R ACAD SCI, V202, P684

[7] MANUFACTURE AND TESTS OF OBJECTIVE ZONE PLATES FOR USE IN A SCANNING-TRANSMISSION X-RAY MICROSCOPE [J]. JOURNAL OF MICROSCOPY-OXFORD, 1985, 138 (JUN): : 301 - 309

[8] THEORETICAL INTERPRETATION OF MOIRE PATTERNS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (02) : 169 - &

[9] RARBACK H, 1980, SCANNED IMAGE MICROS, P449

[10] RARBACK H, 1981, SPIE P, V316

[1] BOGLI V, 1986, SPIE P, V733, P449

[2] CHENG PC, 1984, XRAY MICROSCOPY INST

[3] COANE PJ, 1982, 10TH P C EL ION BEAM

[4] KERN D, 1984, P SOC PHOTO-OPT INST, V447, P204, DOI 10.1117/12.939200

[5] Kirz J., 1980, SYNCHROTRON RAD RES

[6] LAMARQUE P, 1939, C R ACAD SCI, V202, P684

[7] MANUFACTURE AND TESTS OF OBJECTIVE ZONE PLATES FOR USE IN A SCANNING-TRANSMISSION X-RAY MICROSCOPE [J]. JOURNAL OF MICROSCOPY-OXFORD, 1985, 138 (JUN): : 301 - 309

[8] THEORETICAL INTERPRETATION OF MOIRE PATTERNS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (02) : 169 - &

[9] RARBACK H, 1980, SCANNED IMAGE MICROS, P449

[10] RARBACK H, 1981, SPIE P, V316